1. Visualization of the grain structure in the filament cross sections of uniaxially textured high J c Bi-2223 tapes
- Author
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Fumitake Kametani, Goro Osabe, Jianyi Jiang, T. Abiola Oloye, and Shinichi Kobayashi
- Subjects
010302 applied physics ,Materials science ,General Engineering ,General Physics and Astronomy ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,Domain formation ,Protein filament ,0103 physical sciences ,Microscopy ,Critical current ,Texture (crystalline) ,Composite material ,0210 nano-technology ,Grain structure ,Electron backscatter diffraction - Abstract
In this study, we extensively used electron backscatter diffraction orientation imaging microscopy to visualize the grain structure in the flat-rolled (Bi,Pb)2Sr2Ca2Cu3O x (Bi-2223) tapes. The thermomechanical process made the grains’ c-axes oriented normal to the tape surface. The 24% difference in critical current density J c was caused by the ∼5° difference in the degree of out-of-plane texture. Although the in-plane orientations are not controlled, the Bi-2223 grains can form the domains, each of which consists of the grains with similar in-plane orientation. Controlling the domain formation could be the next protocol to raise the J c of Bi-2223 tapes.
- Published
- 2019
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