1. Development of Al-based multilayer optics for EUV
- Author
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Marie-Françoise Ravet-Krill, Marc Roulliay, Evgueni Meltchakov, Françoise Varniere, Françoise Bridou, Y. Menesguen, S. de Rossi, Franck Delmotte, A. Jérome, Christophe Hecquet, Laboratoire Charles Fabry de l'Institut d'Optique / Scop, Laboratoire Charles Fabry de l'Institut d'Optique (LCFIO), Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut d'Optique Graduate School (IOGS)-Centre National de la Recherche Scientifique (CNRS), Laboratoire d'interaction du rayonnement X avec la matière (LIXAM), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), and ANR: ATTOMIX,ATTOMIX
- Subjects
42.70.-a - 61.05.Cm - 68.35.Ct - 78.67.Pt - 81.07.-b ,[PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] ,Materials science ,business.industry ,Superlattice ,Extreme ultraviolet lithography ,Synchrotron radiation ,02 engineering and technology ,General Chemistry ,Surface finish ,021001 nanoscience & nanotechnology ,01 natural sciences ,7. Clean energy ,010309 optics ,chemistry.chemical_compound ,Wavelength ,Optics ,chemistry ,Stack (abstract data type) ,0103 physical sciences ,Silicon carbide ,High harmonic generation ,General Materials Science ,0210 nano-technology ,business - Abstract
International audience; We report on the development of multilayer optics for the extreme ultra-violet (EUV) range. The optical performance of Al-based multilayer mirrors is discussed with regard to promising reflectivity and selectivity characteristics and the problems of the interfacial roughness for this type of multilayers. We demonstrate a possibility to reduce the average roughness by introducing additional metal layer (W or Mo) rather than depositing a buffer layer at each interface. We have prepared and tested Al/SiC, Al/W/SiC and Al/Mo/SiC multilayers of various periods for the spectral range from 15 to 40 nm, which is the range of increasing interest for high-order harmonic generation, synchrotron radiation and astrophysics. The structure of the three-component systems has been optimized in order to obtain the best reflectivity for each wavelength within the spectral range. We have shown that introduction of refractory metal in Al-based periodic stack can improve the optical performance of multilayer reflecting coatings designed for the EUV applications.
- Published
- 2009
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