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Your search keyword '"Korotaev, A. G."' showing total 7 results
Start Over Author "Korotaev, A. G." Journal applied nanoscience
7 results on '"Korotaev, A. G."'

5. TEM studies of structural defects in HgTe/HgCdTe quantum wells

Author

Bonchyk, O. Yu., primary, Savytskyy, H. V., additional, Swiatek, Z., additional, Morgiel, Y., additional, Izhnin, I. I., additional, Voitsekhovskii, A. V., additional, Korotaev, A. G., additional, Mynbaev, K. D., additional, Fitsych, O. I., additional, Varavin, V. S., additional, Dvoretsky, S. A., additional, Mikhailov, N. N., additional, and Yakushev, M. V., additional

Published
2019
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6. Nano-size defects in arsenic-implanted HgCdTe films: a HRTEM study

Author

Bonchyk, O. Yu., primary, Savytskyy, H. V., additional, Swiatek, Z., additional, Morgiel, Y., additional, Izhnin, I. I., additional, Voitsekhovskii, A. V., additional, Korotaev, A. G., additional, Mynbaev, K. D., additional, Fitsych, O. I., additional, Varavin, V. S., additional, Dvoretsky, S. A., additional, Marin, D. V., additional, and Yakushev, M. V., additional

Published
2018
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7. Nano-size defects in arsenic-implanted HgCdTe films: a HRTEM study.

Author

Bonchyk, O. Yu., Savytskyy, H. V., Swiatek, Z., Morgiel, Y., Izhnin, I. I., Voitsekhovskii, A. V., Korotaev, A. G., Mynbaev, K. D., Fitsych, O. I., Varavin, V. S., Dvoretsky, S. A., Marin, D. V., and Yakushev, M. V.

Subjects
DISLOCATION loops, FILM studies, TRANSMISSION electron microscopy, RADIATION damage, ARSENIC, ANNEALING of metals, ARSENATES
Abstract

Radiation damage and its transformation under annealing were studied with bright-field and high-resolution transmission electron microscopy for arsenic-implanted HgCdTe films with graded-gap surface layers. In addition to typical highly defective layers in as-implanted material, a 50 nm-thick sub-surface layer with very low defect density was observed. The main defects in other layers after implantation were dislocation loops, yet after arsenic activation annealing, the dominating defects were single dislocations. Transport (from depth to surface), transformation and annihilation of radiation-induced defects were observed as a result of annealing, with the depth with the maximum defect density decreasing from 110 to 40 nm. [ABSTRACT FROM AUTHOR]

Published
2019
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