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1. Radiative decay of the free neutron.

2. Investigation of attenuation coefficients of some stainless steel and aluminum alloys

3. The spectrum of singly ionized tungsten

4. The calculation of mass attenuation coefficients of well-known thermoluminescent dosimetric compounds at wide energy range

5. Importance of HDR source calibration and measurement

6. Using circle map in pseudorandom bit generation

7. Corrosion detection in steel-reinforced concrete using a spectroscopic technique

8. Modified Chebyshev map based pseudo-random bit generator

9. Application of physical and chemical characterization techniques to metallic powders

10. Atomic data for iron-group elements of astrophysical interest

11. Measurements of infrared spectral directional emittance at NIST - A status update

12. Johnson-noise thermometry based on a quantized-voltage noise source at NIST

13. Randomness analysis on grain - 128 stream cipher

14. Estimation of the extrapolation error in the calibration of type S thermocouples

15. Cryptanalysis of a modified encryption scheme based on bent Boolean function and feedback with carry shift register

16. Development of seismology-based acoustic emission methods for civil infrastructure applications

17. Updated uncertainty budgets for NIST thermocouple calibrations

18. Overview of recent atomic spectroscopy at the NIST Electron Beam Ion Trap (EBIT) facility

19. Chaotic cryptographic scheme and its randomness evaluation

20. Piezoelectric shaker developments for calibration of accelerometers at extended frequencies

21. Fundamental Limits of Optical Patterned Defect Metrology

22. Calibration Of A 14 MeV Neutron Generator With Reference To NBS-1

23. Recent Developments in the NIST Atomic Databases

24. Modeling and Experimental Analysis of Piezoelectric Shakers for High-Frequency Calibration of Accelerometers

25. Piezoelectric Shaker Development for High Frequency Calibration of Accelerometers

26. NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000

27. SPTpol: an instrument for CMB polarization

28. Electronics for a Next-Generation SQUID-Based Time-Domain Multiplexing System

29. A Priori Method of Using Photon Activation Analysis to Determine Unknown Trace Element Concentrations in NIST Standards

30. NIST method for determining model-independent structural information by X-ray reflectometry

31. Yong-Ki Kim — His Life and Recent Work

32. Metrology Related to the Multilayer Mirrors in an Extreme-Ultraviolet Stepper

33. NIST Traceable Small Signal Surface Photo Voltage Reference Wafer

34. Optical Flatness Metrology for 300 mm Silicon Wafers

35. Accurate wavelengths for X-ray spectroscopy and the NIST hydrogen-like ion database

36. New and Expanded Spectroscopic Databases of the National Institute of Standards and Technology (NIST)

37. The NIST Low Temperature ITS-90 Realization and Calibration Facilities

38. NIST Calibration Uncertainties of Liquid-in-Glass Thermometers over the Range from −20 °C to 400 °C

39. The Fundamental Neutron Physics Facilities at NIST

40. NIST Calibration Facility for Sizing Spheres Suspended in Liquids

41. Accurate Measurements of Temperatures in the DUV Post-Exposure Bake Process

42. Argon Triple-Point Apparatus for SPRT Calibration

43. Characterization and Calibration of Lightpipe Radiation Thermometers for Use in Rapid Thermal Processing

44. NIST Accelerator Facilities And Programs In Support Of Industrial Radiation Research

45. Critical Dimension Calibration Standards for ULSI Metrology

46. European Dissemination of the Ultra-low Temperature Scale, PLTS-2000

47. Internal Measurement Assurance for the NIST Realization of the ITS-90 from 83.8 K to 1234.93 K

48. Recent Results of NIST Realizations of the ITS-90 below 84 K

49. A primary standard for 157 nm excimer laser measurements

50. Development of Metrology at NIST for the Semiconductor Industry

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