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High-resolution Resonant Inelastic X-ray Scattering (RIXS) requires diffraction gratings with very exacting characteristics. The gratings should provide both very high dispersion and high efficiency which are conflicting requirements and extremely challenging to satisfy in the soft x-ray region for a traditional grazing incidence geometry. To achieve high dispersion one should increase the groove density of a grating; this however results in a diffraction angle beyond the critical angle range and results in drastic efficiency loss. The problem can be solved by use of multilayer coated blazed gratings (MBG). In this work we have investigated the diffraction characteristics of MBGs via numerical simulations and have developed a procedure for optimization of grating design for a multiplexed high resolution imaging spectrometer for RIXS spectroscopy to be built in sector 6 at the Advanced Light Source (ALS). We found that highest diffraction efficiency can be achieved for gratings optimized for 4th or 5th ord...

We report on the design and construction of a higher energy Scanning Transmission X‐ray Microscope on a new bend magnet beam line at the Advanced Light Source. Previously we have operated such an instrument on a bend magnet for C, N and O 1s NEXAFS spectroscopy. The new instrument will have similar performance at higher energies up to and including the S 1s edge at 2472eV. A new microscope configuration is planned. A more open geometry will allow a fluorescence detector to count emitted photons from the front surface of the sample. There will be a capability for zone plate scanning in addition to the more conventional sample scanning mode. This will add the capability for imaging a massive sample at high resolution over a limited field of view, so that heavy reaction cells may be used to study processes in‐situ, exploiting the longer photon attenuation length and the longer zone plate working distances available at higher photon energy. The energy range will extend down to include the C1s edge at 300eV, to allow high energy NEXAFS microscopic studies to correlate with the imaging of organics in the same sample region of interest.

There is a need for higher resolution spectrometers as a tool for inelastic x‐ray scattering. Currently, resolving power around R = 10,000 is advertised. Measured RIXS spectra are often limited by this instrumental resolution and higher resolution spectrometers using conventional gratings would be prohibitively large. We are engaged in a development program to build blazed multilayer grating structures for diffracting soft x‐rays in high order. This leads to spectrometers with dispersion much higher than is possible using metal coated‐gratings. The higher dispersion then provides higher resolution and the multilayer gratings are capable of operating away from grazing incidence as required. A spectrometer design is presented with a total length 3.8 m and capable of 105 resolving power.

We report on the current state of surface slope metrology on deformable mirrors for soft x-rays at the Advanced Light Source (ALS). While we are developing techniques for in situ at-wavelength tuning, we are refining methods of ex situ visible-light optical metrology to achieve sub-100-nrad accuracy. This paper reports on laboratory studies, measurements and tuning of a deformable test-KB mirror prior to its use. The test mirror was bent to a much different optical configuration than its original design, achieving a 0.38 micro-radian residual slope error. Modeling shows that in some cases, by including the image conjugate distance as an additional free parameter in the alignment, along with the two force couples, fourth-order tangential shape errors (the so-called bird shape) can be reduced or eliminated.

An ultra‐high resolution beamline is being constructed at the Advanced Light Source (ALS) for the study of low energy excitations in strongly correlated systems with the use of high‐resolution inelastic scattering and angle‐resolved photoemission. This new beamline, given the acronym Merlin (for meV resolution line), will cover the energy range 10–150 eV. The monochromator has fixed entrance and exit slits and a plane mirror that can illuminate a spherical grating at the required angle of incidence (as in the SX‐700 mechanism). The monochromator can be operated in two different modes. In the highest resolution mode, the energy scanning requires translating the monochromator chamber (total travel 1.1 m) as well as rotating the grating and the plane mirror in front of the grating. The resolution in this mode is practically determined by the slits width. In the second mode, the scanning requires rotating the grating and the plane mirror. This mode can be used to scan a few eV without a significant resolution loss. The source for the beamline is a 1.9 m long, 90 mm period quasi periodic EPU. The expected flux at the sample is higher than 1011 photons/s at a resolving power of 5 × 104 in the energy range 16–130 eV. A second set of gratings can be used to obtain higher flux at the expense of resolution.

As the emittance of SR rings approaches the diffraction limit for soft x‐rays, one requires not only excellence in design and performance of the optical elements, but also precision and performance of mechanical components, such as mirror manipulators, monochromator scanners and exit slits. We will present simple but efficient solutions for the mechanical systems of this type, commonly encountered in soft x‐ray beamlines. These solutions have been implemented and their performance evaluated with test results from the spectromicroscopy beamline at the Canadian Light Source.

General purpose refocus mirrors using Kirkpatrick-Baez geometry have been designed, built and installed at a new undulator beam-line facility to provide spot sizes smaller than 10 microns for specialized spectroscopy experiments at the Advanced Light Source. All the available flux is focused and the focal length is adjustable. The mirrors are fully computer controlled and can be detuned to create a spot as big as 500 microns.

The spectromicroscopy beamline (SM) at the Canadian Light Source (CLS) will provide 100 – 2000 eV photons in a high brightness, high flux, medium resolution and small spot size beam. The beamline consists of an advanced elliptically polarized undulator (EPU) source and a novel entrance slit‐less plane grating monochromator which feeds two branch lines, one optimized for scanning transmission X‐ray microscopy (STXM), the other for X‐ray photoemission electron microscopy (X‐PEEM). This article outlines the beamline design strategy, and discusses the design optimization relative to the requirements for state‐of‐the‐art STXM and X‐PEEM.

The interfaces between solid mineral particles and water play a crucial role in partitioning and chemical transformation of many inorganic as well as organic pollutants in environmental systems. Among environmentally significant minerals, mixed-valent oxides and hydroxides of iron (e.g. magnetite, green rusts) and manganese (hausmanite, birnessite) have been recognized as particularly strong sorbents for metal ions. In addition, minerals containing Fe(II) have recently been proven to be powerful reductants for a wide range of pollutants. Chemical properties of these minerals strongly depend on the distribution and availability of reactive sites and little is known quantitatively about the nature of these sites. We have investigated the bulk distribution of charge states of manganese (Mn (II, III, IV)) and iron (Fe(II, III)) in single particles of natural manganese nodules and synthetic green rusts using Scanning Transmission X-ray SpectroMicroscopy (STXM). Pixel resolved spectra (XANES) extracted from sta...