1. Predicting credit default using ML.
- Author
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Dalal, Priya and Sharma, Tripti
- Subjects
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NATURAL language processing , *TECHNOLOGICAL risk assessment , *CREDIT risk , *DEFAULT (Finance) , *DATABASES , *MACHINE learning - Abstract
After Implementing the machine learning (ML) algos for the prediction of potential defaulters (someone who can't repay the loan properly and timely) has been connected with way better predictions; The creation of novel model dangers is aided by this, especially those connected to the organizational validation methods. Recent surveys carried out by industry have often underlined the unpredictable nature of managers and interpreting these risks may be a barrier to the revolution. As part of this project, we'll attempt to create a novel approach and methodology for monitoring model-risk adjustments so that we can assess the effectiveness of various machine learning approaches. To address this, we first identify up to 13 risk variables using a process based on internal evaluations, which we then classify into three major types: statistics, technology, and market behavior. Then, in order to determine whether each risk category is applicable in the context of three hypothetical use cases, we create a number of formal documents. We calculate the weight of each category in order of strength of mention using natural language processing and expert-based risk phrases: regulatory capital, credit scoring, and provisioning. Finally, we analyze various components of a set of risk variables that we think to be representative in order to test the system using well-known credit risk machine learning models and a public database (from kaggle.com). The quantity of hyper parameters and the precision of the forecasts were used to quantify statistical risk. Algorithmic transparency and M-L training technique delay are used to evaluate technological risk, while Shapley's additive explanations are used to elucidate the result, market behavior risk is calculated across the period of time required to conduct the post-test technique. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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