Search

Superior thermal stability of resistive switching performance is essential for resistive random access memory (R-RAM) device with high reliability. Thermal stable resistive switching performance can be achieved in ZnO/BiFeO3 bilayer structure by modifying the interface. The bilayer structure with a distinct interface is fabricated with an optimized annealing process in chemical solution deposition method. This bilayer structure shows a better thermal stability compared to the case with an indistinct interface. Attempt has been made to explain such effects based on conductive filament mechanism. We propose that the confinement of the oxygen vacancies migration at distinct interface could be the reason for the thermal stability. Our results indicate that morphology of interface is an important factor to improve the thermal stability of R-RAM.

This work aims to give a comprehensive view of magnetic state stability and transformations in PZT-film/FeGa-dot multiferroic composite systems due to the combining effects of size, shape and interfacial coupling strain. It is found that the stable magnetic state of the FeGa nanodots is not only a function of the size and shape of the nanodot but also strongly sensitive to the interfacial coupling strain modified by the polarization state of PZT film. In particular, due to the large magnetostriction of FeGa, the phase boundaries between different magnetic states (i.e., in-plane/out-of-plane polar states, and single-/multi-vortex states) of FeGa nanodots can be effectively tuned by the polarization-mediated strain. Fruitful strain-mediated transformation paths of magnetic states including those between states with different orderings (i.e., one is polar and the other is vortex), as well as those between states with the same ordering (i.e., both are polar or both are vortex) have been revealed in a comprehensive view. Our result sheds light on the potential of utilizing electric field to induce fruitful magnetic state transformation paths in multiferroic film-dot systems towards a development of novel magnetic random access memories.

Phase field simulations are performed to investigate the domain structures of soft ferromagnetic nanodots. It is found that the stability of the domain state is sensitive to its lateral dimensions. As the lateral dimensions increase, the stable domain state gradually changes from polar to vortex, with a transitional region where both the two ordered states are stable. Interestingly, the phase diagram is also a strong function of mechanical loads. By appropriately choosing the lateral dimensions, transformations between polar and vortex states can be induced or controlled by mechanical loads. The study provides instructive information for the applications of ferromagnetic nanostructures.

Pb(Zr0.53Ti0.47)O3 (PZT) thin film was fabricated on Pt/Ti/SiO2/Si substrate by chemical solution deposition method. Our results show a very great switchable ferroelectric diode effect (SFDE) in Pt-PZT-Au structure, which is more obvious and controllable than that in other ferroelectric thin films. The electrical conduction exhibits high rectifying behavior after pre-poling and the polarity of ferroelectric diode can be switched by changing the orientation of polarization in ferroelectric thin film. Our results also indicate that the SFDE in PZT film is highly dependent on remanent polarization and temperature. With the increase of remanent polarization, the forward current of bistable rectifying behavior observably reduces. Therefore, our measurement indicated that the biggest rectification ratio can reach about 220, which is found in 250K after +10V poling. By analyzing the conduction data, it is found that the dominant conduction mechanism of the SFDE in this sample is due to the space-charge-limited bulk conduction (SCLC), and Schottky emission (SE) may play subordinate role in forward bias voltage. Our observation demonstrates that SFDE may be general characteristic in ferroelectrics as long as proper electrodes chosen.

As functions of the paraelectric layer thickness, misfit strain and temperature, the electrocaloric properties of ferroelectric-paraelectric superlattices are investigated using a time-dependent Ginzburg-Landau thermodynamic model. Ferroelectric phase transition driven by the relative thickness of the superlattice is found to dramatically impact the electrocaloric response. Near the phase transition temperature, the magnitude of the electrocaloric effect is maximized and shifted to lower temperatures by increasing the relative thickness of paraelectric layer. Theoretical calculations also imply that the electrocaloric effect of the superlattices depends not only on the relative thickness of paraelectric layer but also on misfit strain. Furthermore, control of the relative thickness of paraelectric layer and the misfit strain can change availably both the magnitude and the temperature sensitivity of the electrocaloric effect, which suggests that ferroelectric-paraelectric superlattices may be promising candidates for use in cooling devices in a wide temperature range.