1. High‐Throughput Growth of Wafer‐Scale Monolayer Transition Metal Dichalcogenide via Vertical Ostwald Ripening
- Author
-
Insu Jeon, Keun Wook Shin, Yeonchoo Cho, Minsu Seol, Haeryong Kim, Min-Hyun Lee, Jiwoong Park, Myoungho Jeong, Hyeon-Jin Shin, and Hyung-Ik Lee
- Subjects
Ostwald ripening ,Materials science ,business.industry ,Mechanical Engineering ,Nucleation ,02 engineering and technology ,Chemical vapor deposition ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,0104 chemical sciences ,chemistry.chemical_compound ,symbols.namesake ,chemistry ,Mechanics of Materials ,Monolayer ,Batch processing ,symbols ,Optoelectronics ,General Materials Science ,Wafer ,Field-effect transistor ,0210 nano-technology ,business ,Molybdenum disulfide - Abstract
For practical device applications, monolayer transition metal dichalcogenide (TMD) films must meet key industry needs for batch processing, including the high-throughput, large-scale production of high-quality, spatially uniform materials, and reliable integration into devices. Here, high-throughput growth, completed in 12 min, of 6-inch wafer-scale monolayer MoS2 and WS2 is reported, which is directly compatible with scalable batch processing and device integration. Specifically, a pulsed metal-organic chemical vapor deposition process is developed, where periodic interruption of the precursor supply drives vertical Ostwald ripening, which prevents secondary nucleation despite high precursor concentrations. The as-grown TMD films show excellent spatial homogeneity and well-stitched grain boundaries, enabling facile transfer to various target substrates without degradation. Using these films, batch fabrication of high-performance field-effect transistor (FET) arrays in wafer-scale is demonstrated, and the FETs show remarkable uniformity. The high-throughput production and wafer-scale automatable transfer will facilitate the integration of TMDs into Si-complementary metal-oxide-semiconductor platforms.
- Published
- 2020
- Full Text
- View/download PDF