1. Scanning Kelvin Probe Microscopy Reveals Planar Defects Are Sources of Electronic Disorder in Organic Semiconductor Crystals
- Author
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Christopher J. Douglas, Yanfei Wu, Kathryn A. McGarry, C. Daniel Frisbie, Matthew J. Bruzek, and Xinglong Ren
- Subjects
Diffraction ,Materials science ,business.industry ,technology, industry, and agriculture ,Stacking ,Scanning kelvin probe microscopy ,Nanotechnology ,02 engineering and technology ,Scanning capacitance microscopy ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,Isotropic etching ,0104 chemical sciences ,Electronic, Optical and Magnetic Materials ,Organic semiconductor ,Planar ,Scanning ion-conductance microscopy ,Optoelectronics ,0210 nano-technology ,business - Abstract
Electronic disorder in organic semiconductor single crystals, manifested as parallel surface potential domains with potential variations ranging from tens to hundreds of mV, is observed by scanning Kelvin probe microscopy. Chemical etching and X-ray diffraction indicate that the potential domains are correlated with planar defects such as stacking faults. The results have important implications for understanding structure–transport relationships in organic semiconductor single crystals.
- Published
- 2017