1. Homology metrics for microstructure response fields in polycrystals
- Author
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Thomas Wanner, Edwin R. Fuller, and David M. Saylor
- Subjects
Materials science ,Polymers and Plastics ,Misorientation ,Metals and Alloys ,Homology (mathematics) ,Microstructure ,Finite element method ,Thermal expansion ,Electronic, Optical and Magnetic Materials ,Condensed Matter::Materials Science ,Condensed Matter::Superconductivity ,Ceramics and Composites ,Principal stress ,Statistical physics ,Crystallite ,Anisotropy - Abstract
Quantitative homology metrics are proposed for characterizing the thermal–elastic response of polycrystalline materials. Simulations for a calcite-based polycrystal, marble, are used as an illustrative example. The homology metrics are based on topological measurements, such as the number of components and the number of handles of the thermal–elastic response fields for a complex microstructure. These homology metrics are applied to characterize not only the elastic energy density and maximum principal stress response fields in a polycrystal but also the correlated grain-boundary misorientation distributions that influenced the formation of these response fields. It is demonstrated that the topological analysis can quantitatively distinguish between different types of grain-boundary misorientations, as well as between differences in the resulting response fields.
- Published
- 2010
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