1. Autonomous Scanning Probe Microscopy in Situ Tip Conditioning through Machine Learning
- Author
-
Robert A. Wolkow and Mohammad Rashidi
- Subjects
In situ ,Computer science ,General Physics and Astronomy ,Model system ,02 engineering and technology ,010402 general chemistry ,Machine learning ,computer.software_genre ,01 natural sciences ,Convolutional neural network ,law.invention ,Scanning probe microscopy ,law ,General Materials Science ,business.industry ,General Engineering ,Dangling bond ,021001 nanoscience & nanotechnology ,0104 chemical sciences ,Characterization (materials science) ,Test case ,Artificial intelligence ,Scanning tunneling microscope ,0210 nano-technology ,business ,computer - Abstract
Atomic-scale characterization and manipulation with scanning probe microscopy rely upon the use of an atomically sharp probe. Here we present automated methods based on machine learning to automatically detect and recondition the quality of the probe of a scanning tunneling microscope. As a model system, we employ these techniques on the technologically relevant hydrogen-terminated silicon surface, training the network to recognize abnormalities in the appearance of surface dangling bonds. Of the machine learning methods tested, a convolutional neural network yielded the greatest accuracy, achieving a positive identification of degraded tips in 97% of the test cases. By using multiple points of comparison and majority voting, the accuracy of the method is improved beyond 99%.
- Published
- 2018