1. Removal and Reoccurrence of LLZTO Surface Contaminants under Glovebox Conditions.
- Author
-
Siniscalchi M, Gibson JS, Tufnail J, Swallow JEN, Lewis J, Matthews G, Karagoz B, van Spronsen MA, Held G, Weatherup RS, Grovenor CRM, and Speller SC
- Abstract
The reactivity of Li
6.4 La3 Zr1.4 Ta0.6 O12 (LLZTO) solid electrolytes to form lithio-phobic species such as Li2 CO3 on their surface when exposed to trace amounts of H2 O and CO2 limits the progress of LLZTO-based solid-state batteries. Various treatments, such as annealing LLZTO within a glovebox or acid etching, aim at removing the surface contaminants, but a comprehensive understanding of the evolving LLZTO surface chemistry during and after these treatments is lacking. Here, glovebox-like H2 O and CO2 conditions were recreated in a near ambient pressure X-ray photoelectron spectroscopy chamber to analyze the LLZTO surface under realistic conditions. We find that annealing LLZTO at 600 °C in this atmosphere effectively removes the surface contaminants, but a significant level of contamination reappears upon cooling down. In contrast, HCl(aq) acid etching demonstrates superior Li2 CO3 removal and stable surface chemistry post treatment. To avoid air exposure during the acid treatment, an anhydrous HCl solution in diethyl ether was used directly within the glovebox. This novel acid etching strategy delivers the lowest lithium/LLZTO interfacial resistance and the highest critical current density.- Published
- 2024
- Full Text
- View/download PDF