4 results on '"Massengill, L. W."'
Search Results
2. Predicting the vulnerability of memories to muon-induced SEUs with low-energy proton tests informed by Monte Carlo simulations
3. SE performance of a Schmitt-trigger-based D-flip-flop design in a 16-nm bulk FinFET CMOS process
4. Hardware based empirical model for predicting logic soft error cross-section
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.