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In this work, an efficient hardware architecture of modulo 2n + 1 squarer is proposed and validated. The proposed modulo 2n + 1 squarer use novel compressor designs and sparse tree adders as primitive building blocks for fast low-power operations in three major functional modules including partial products generation module, partial products reduction module and final stage addition module. The resulting modulo 2n + 1 squarer has been implemented in standard CMOS (Complementary Metal-Oxide Semiconductor) cell technology and compared both qualitatively and quantitatively with the existing hardware implementations. The unit gate model analysis and the experimental results show that the proposed implementation is faster and consume less power than existing hardware implementations.

The delay-insensitive Null Convention Logic (NCL) as one of innovative asynchronous logic design methodologies has many advantages of inherent robustness, power consumption, and easy design reuses. However, transistor-level topologies of conventional NCL gates have weakness of logic speed, area overhead or wire complexity. Therefore, this paper proposes a new NCL gates designed at transistor level for high-speed, low area overhead. A 4×4 multiplier using the proposed NCL gates has been compared to the multiplier using conventional NCL gates in terms of delay, area and energy consumption.

In nanometer technology, accurate circuit aging prediction of MOSFET digital circuits caused by aging phenominon is one of the most critical issues for more reliable adaptive tuning system design. This paper proposes a new on-chip aging sensor circuit to predit and detect a circuit failure caused by BTI and HCI aging effects on digital circuits. The proposed circuit is based on timing warning windows to warn against a guardband violation of sequential circuits, and generates three warning bits right before circuit failures occur.

In this paper, a 12-bit high resolution, power and area efficiency hybrid digital pulse width modulator (DPWM) with process and temperature (PT) calibration is proposed for digital controlled DC-DC converters. The complete circuits design has been verified under different corners of CMOS 0.18um process technology node.

This paper describes technology for diagnosis SoC HDL-models, based on transaction graph. Diagnosis method is focused on decreasing the time of fault detection and memory for storage of diagnosis matrix by means of forming ternary relations between test, monitor, and functional component. A method for analyzing the activation matrix to detect the faulty blocks with given depth and synthesis logic functions for subsequent embedded hardware fault diagnosis is given.