1. SiGe HBT technology with fT/fmax of 300GHz/500GHz and 2.0 ps CML gate delay
- Author
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D. Bolze, H. Rucker, D. Knoll, Thomas Grabolla, Bernd Heinemann, Yuji Yamamoto, Gunter Fischer, R. Kurps, C. Wipf, O. Fursenko, Bernd Tillack, Ulrich Haak, A. Fox, M. A. Schubert, J. Schmidt, J. Drews, D. Schmidt, R. Barth, M. Lisker, D. Wolansky, and Steffen Marschmeyer
- Subjects
Materials science ,business.industry ,Heterojunction bipolar transistor ,Electrical engineering ,Ring oscillator ,Salicide ,Silicon-germanium ,chemistry.chemical_compound ,chemistry ,Logic gate ,Silicon carbide ,Optoelectronics ,business ,Common emitter - Abstract
A SiGe HBT technology featuring f T /f max /BV CEO =300GHz/500GHz/1.6V and a minimum CML ring oscillator gate delay of 2.0 ps is presented. The speed-improvement compared to our previous SiGe HBT generations originates from lateral device scaling, a reduced thermal budget, and changes of the emitter and base composition, of the salicide resistance as well as of the low-doped collector formation.
- Published
- 2010