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Start Over Author "Jakub Janicki" Journal 2010 ieee international test conference
1 results on '"Jakub Janicki"'

1. Dynamic channel allocation for higher EDT compression in SoC designs

Author

Jakub Janicki, M. Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Jerzy Tyszer, and Janusz Rajski

Subjects
Reduction (complexity), Multi-core processor, Job shop scheduling, Channel allocation schemes, Computer science, business.industry, Encoding (memory), Embedded system, System on a chip, business, Test data, Data compression
Abstract

The paper presents a preemptive test application scheme for system-on-chip (SoC) designs with EDT-based compression. It seamlessly combines a new test data reduction technique with a test scheduling algorithm and a novel test access mechanism. It is particularly well suited for SoC devices comprising non-isolated cores, i.e., blocks that occasionally need to be tested simultaneously.

Published
2010

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