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Your search keyword '"Rooyackers, R."' showing total 4 results

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4 results on '"Rooyackers, R."'

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1. Atomistic modeling of impurity ion implantation in ultra-thin-body Si devices

2. First observation of FinFET specific mismatch behavior and optimization guidelines for SRAM scaling

3. Impact of Strain on ESD Robustness of FinFET Devices

4. Full-field EUV and immersion lithography integration in 0.186μm2 FinFET 6T-SRAM cell

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