1. OCI: Open Compression Interface
- Author
-
Benoit Nadeau-Dostie, Rohit Kapur, Bruce Cory, Mick Tegethoff, Brion Keller, Mark Kassab, Dwayne Burek, Steve Oakland, and Kee Kim
- Subjects
Engineering ,Boundary scan ,Standardization ,business.industry ,Interface (computing) ,Compression (functional analysis) ,Embedded system ,Scan chain ,Test compression ,System on a chip ,Pattern generation ,business - Abstract
Before on-chip scan compression, it was possible to use different EDA tool vendors to do scan insertion, pattern generation, and diagnosis. On-chip scan compression changed that use model since each tool vendor supplied a different type of scan compression logic and had tool-specific ways to pass necessary information from scan insertion to pattern generation and from pattern generation to diagnosis. OCI (Open Compression Interface) is a standardization of how the necessary data is passed from test logic insertion to pattern generation to diagnosis such that different vendors can be used for each step independent of the on-chip scan compression logic used. This document discusses the need for OCI and gives a conceptual overview of the OCI standard.
- Published
- 2006