Search

Your search keyword '"Gino Giusi"' showing total 2 results
Start Over Author "Gino Giusi" Journal 2006 ieee instrumentation and measurement technology conference proceedings
2 results on '"Gino Giusi"'

1. Dedicated Instrumentation for Single-Electron Effects Detection in Si Nanocrystal Memories

Author

Salvatore Lombardo, Felice Crupi, Gino Giusi, and Calogero Pace

Subjects
Bandwidth, Drain current, Integrated circuits, MOSFET devices, Nanocrystals, Silicon, Floating gate, Low noise acquisition system, MOSFET memory integrated circuits, Wafer-level measurements, Nonvolatile storage, Spectrum analyzer, Noise measurement, business.industry, Computer science, System of measurement, Bandwidth (signal processing), Background noise, Non-volatile memory, Data acquisition, Hardware_GENERAL, MOSFET, Bandwidth (computing), Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Optoelectronics, Instrumentation (computer programming), Floating-gate MOSFET, business
Abstract

In this paper we propose a purposely designed instrumentation and the experimental set-up for the detection of single-electron phenomena in solid-state non-volatile memories based on silicon nanocrystals floating gate MOSFET. The stepwise evolution of the drain current of a memory cell, after a "write" operation, is monitored by means of a purposely designed low noise acquisition system with a bandwidth up to 10 kHz. The advantage of the measurement system background noise and bandwidth over traditional semiconductor parameter analyzer performance is evident on the detection and classification of single-electron events.

Published
2006

2. Instrumentation Design for Gate and Drain Low Frequency Noise Measurements

Author

Gino Giusi, Felice Crupi, Calogero Pace, and Carmine Ciofi

Subjects
Materials science, Noise measurement, Preamplifier, Computer science, business.industry, System of measurement, Infrasound, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Noise (electronics), CMOS, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Instrumentation (computer programming), business, AND gate, Voltage
Abstract

In this paper we present an on-wafer measurement system suited for the characterization of low frequency current noise in CMOS devices. Guidelines for designing the preamplifier and the bias stage at the drain and gate terminals are discussed. A simple implementation of the proposed design approach is reported. The system capability is tested through 1/f noise measurements in advanced CMOS devices.

Published
2006

Catalog

Books, media, physical & digital resources
See catalog results