19 results on '"Toshiki, Nakamura"'
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2. Description and Discussion on DCASE2020 Challenge Task2: Unsupervised Anomalous Sound Detection for Machine Condition Monitoring.
3. Privacy-Aware Data-Lifetime Control NAND Flash System for Right to be Forgotten with In-3D Vertical Cell Processing.
4. Scene Text Magnifier.
5. Layer-by-layer Adaptively Optimized ECC of NAND flash-based SSD Storing Convolutional Neural Network Weight for Scene Recognition.
6. Data-Aware Partial ECC with Data Modulation of ReRAM with Non-volatile In-memory Computing for Image Recognition with Deep Neural Network.
7. Endurance-based Dynamic VTHDistribution Shaping of 3D-TLC NAND Flash Memories to Suppress Both Lateral Charge Migration and Vertical Charge De-trap and Increase Data-retention Time by 2.7x.
8. 9.1x Error acceptable adaptive artificial neural network coupled LDPC ECC for charge-trap and floating-gate 3D-NAND flash memories.
9. MIMII DUE: Sound Dataset for Malfunctioning Industrial Machine Investigation and Inspection with Domain Shifts due to Changes in Operational and Environmental Conditions.
10. n-hot: Efficient bit-level sparsity for powers-of-two neural network quantization.
11. Adaptive Artificial Neural Network-Coupled LDPC ECC as Universal Solution for 3-D and 2-D, Charge-Trap and Floating-Gate NAND Flash Memories.
12. 3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition.
13. Scene Text Eraser.
14. 12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition.
15. Description and Discussion on DCASE2020 Challenge Task2: Unsupervised Anomalous Sound Detection for Machine Condition Monitoring.
16. An on-chip, electricity-free and single-layer pressure sensor for microfluidic applications.
17. Scene Text Magnifier.
18. Error elimination ECC by horizontal error detection and vertical-LDPC ECC to increase data-retention time by 230% and acceptable bit-error rate by 90% for 3D-NAND flash SSDs.
19. Scene Text Eraser.
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