4 results on '"H W Chen"'
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2. The Demonstration of Gate Dielectric-fuse 4kb OTP Memory Feasible for Embedded Applications in High-k Metal-gate CMOS Generations and Beyond.
3. Electrical characteristics and reliability properties of metal-oxide-semiconductor capacitors with HfZrLaO gate dielectrics.
4. Impact of Hf content on positive bias temperature instability reliability of HfSiON gate dielectrics.
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