6 results on '"Eugenio Dentoni Litta"'
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2. Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation.
3. Enabling Active Backside Technology for ESD and LU Reliability in DTCO/STCO.
4. Step tunneling-enhanced hot-electron injection in vertical graphene base transistors.
5. Improved low-frequency noise for 0.3nm EOT thulium silicate interfacial layer.
6. Mobility enhancement by integration of TmSiO IL in 0.65nm EOT high-k/metal gate MOSFETs.
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