Author: "Choong-Un Kim" / Database: dblp computer science bibliography - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Choong-Un Kim"' showing total 4 results

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4 results on '"Choong-Un Kim"'

1. Study of Thermomechanical Damage Mechanism in Al Interconnects in Al-SiO2 structure by High Density Peak Current.

Author: Hariram Mohanram, Harikrishnan Kumarasamy, Choong-Un Kim, Young-Joon Park, and Srikanth Krishnan
Published: 2024
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2. Advanced Methods of Detecting Physical Damages in Packaging and BEOL Interconnects.

Author: Jorge Mendoza, Jimmy-Bao Le, Choong-Un Kim, and Hung-Yun Lin
Published: 2023
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3. Mechanisms of Contact Formation and Electromigration Reliability in Wirebond Packages.

Author: Allison T. Osmanson, Mohsen Tajedini, Yi Ram Kim, Hossein Madanipour, Choong-Un Kim, Bradley Glasscock, and Muhammad Khan
Published: 2021
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4. Effects of UBM Thickness and Current Flow Configuration on Electromigration Failure Mechanisms in Solder Interconnects.

Author: Yi Ram Kim, Allison T. Osmanson, Hossein Madanipour, Choong-Un Kim, Patrick F. Thompson, and Qiao Chen
Published: 2020
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