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Despite significant advances in the field of freeform optical design, there still remain various unsolved problems. One of these is the design of smooth, shallow freeform topologies, consisting of multiple convex, concave and saddle shaped regions, in order to generate a prescribed illumination pattern. Such freeform topologies are relevant in the context of glare-free illumination and thin, refractive beam shaping elements. Machine learning techniques already proved to be extremely valuable in solving complex inverse problems in optics and photonics, but their application to freeform optical design is mostly limited to imaging optics. This paper presents a rapid, standalone framework for the prediction of freeform surface topologies that generate a prescribed irradiance distribution, from a predefined light source. The framework employs a 2D convolutional neural network to model the relationship between the prescribed target irradiance and required freeform topology. This network is trained on the loss between the obtained irradiance and input irradiance, using a second network that replaces Monte-Carlo raytracing from source to target. This semi-supervised learning approach proves to be superior compared to a supervised learning approach using ground truth freeform topology/irradiance pairs; a fact that is connected to the observation that multiple freeform topologies can yield similar irradiance patterns. The resulting network is able to rapidly predict smooth freeform topologies that generate arbitrary irradiance patterns, and could serve as an inspiration for applying machine learning to other open problems in freeform illumination design.

We investigate - both experimentally and theoretically - the inelastic interaction between fast electrons and the electromagnetic field scattered by metallic apertures and nanostructures on dielectric membranes using photon induced near-field electron microscopy. The experiments - performed in a high brightness ultrafast transmission electron microscope - on gold apertures on silicon nitride membranes reveal strong modulations of the electron-light coupling strength. We demonstrates that this effect results from the combined action of the electric field scattered by the aperture edges and the reflection and transmission of the incident wave by the dielectric membrane. Moreover, when a nanostructure is added inside the metallic aperture, the new scattered field interferes with the previous contributions, thus imprinting the optical response of the nanostructure in additional modulations of the electron-light coupling strength. Using systematic electrodynamics simulations based on the Green dyadic method, we quantitatively analyze these different contributions to the electron-light coupling and propose further applications.

In this paper we describe the technical implementation of pump-probe cathodoluminescence microscopy (PP-CL), a novel technique for studying ultrafast dynamics in materials using combined excitation of electron and laser pulses. The PP-CL setup is based on a commercial scanning electron microscope combined with a femtosecond laser. Here we discuss the design, technical details, and characterization of the PP-CL setup. The luminescence emitted by the sample (either photoluminescence, cathodoluminescence or a combination of both) can be analyzed in terms of spectrum, temporal statistics, and frequency-modulated intensity (lock-in detection). The laser spot on the sample is characterized by analyzing the changes in the secondary electron signal on a GaN substrate, from which we extract a laser spot size in the $\mu m$ range. While this method ensures spatial overlap of laser and electron pulses on the sample, temporal alignment is achieved using time-correlated measurements of photoluminescence and cathodoluminescence. We also discuss some considerations to take into account when designing a PP-CL experiment, regarding temporal and spatial resolution. This paper provides a detailed reference for the development of any PP-CL microscope.

Ultra-fast transmission electron microscopy (UTEM) combines sub-picosecond time-resolution with the versatility of TEM spectroscopies. It allows one to study the dynamics of materials properties combining complementary techniques. However, until now, time-resolved cathodoluminescence, which is expected to give access to the optical properties dynamics, was still unavailable in a UTEM. In this paper, we report time-resolved cathodoluminescence measurements in an ultrafast transmission electron microscope. We measured lifetime maps, with a 12 nm spatial resolution and sub-nanoseconds resolution, of nano-diamonds with a high density of NV center. This study paves the way to new applications of UTEM and to correlative studies of optically active nanostructures., Comment: Supplementary information at the end of the article

Thermal properties have an outsized impact on efficiency and sensitivity of devices with nanoscale structures, such as in integrated electronic circuits. A number of thermal conductivity measurements for semiconductor nanostructures exist, but are hindered by the diffraction limit of light, the need for transducer layers, the slow-scan rate of probes, ultra-thin sample requirements, or extensive fabrication. Here, we overcome these limitations by extracting temperature from measurements of bandgap cathodoluminescence in GaN nanowires with spatial resolution limited by the electron cascade, and use this to determine thermal conductivities in the range of 19-68 W/m*K in three new ways. The electron beam acts simultaneously as a temperature probe and as a controlled delta-function-like heat source to measure thermal conductivities using steady-state methods, and we introduce a frequency-domain method using pulsed electron beam excitation. The different thermal conductivity measurements we explore agree within error where comparable. Our results provide novel methods of measuring thermal properties that allow for rapid, in-situ, high-resolution measurements of integrated circuits and semiconductor nanodevices, and open the door for electron-beam based nanoscale phonon transport studies.

Photon bunching in incoherent cathodoluminescence (CL) spectroscopy originates from the fact that a single high-energy electron can generate multiple photons when interacting with a material, thus revealing key properties of electron-matter excitation. Contrary to previous works based on Monte-Carlo modelling, here we present a fully analytical model describing the amplitude and shape of the second order autocorrelation function ($g^{(2)}(\tau)$) for continuous and pulsed electron beams. Moreover, we extend the analysis of photon bunching to ultrashort electron pulses, in which up to 500 electrons per pulse excite the sample within a few picoseconds. We obtain a simple equation relating the bunching strength ($g^{(2)}(0)$ to the electron excitation efficiency ($\gamma$), electron beam current, emitter decay lifetime and pulse duration, in the case of pulsed electron beams. The analytical model shows good agreement with experimental data obtained on InGaN/GaN quantum wells using continuous, ns-pulsed (using beam blanker) and ultrashort ps-pulsed (using photoemission) electron beams. We extract excitation efficiencies of 0.13 and 0.05 for 10 and 8 keV electron beams, respectively, and we observe that non-linear effects play no compelling role even after excitation with ultrashort and dense electron cascades in the quantum wells., Comment: 29 pages (including supplementary information), 14 figures (including supplementary figures)

Nitrogen-vacancy (NV) centers in diamond are reliable single-photon emitters, with applications in quantum technologies and metrology. Two charge states are known for NV centers: NV$^0$ and NV$^-$, with the latter being mostly studied due to its long electron spin coherence time. Therefore, control over the charge state of the NV centers is essential. However, an understanding of the dynamics between the different states still remains challenging. Here, conversion from NV$^-$ to NV$^0$ due to electron-induced carrier generation is shown. Ultrafast pump-probe cathodoluminescence spectroscopy is presented for the first time, with electron pulses as pump, and laser pulses as probe, to prepare and read out the NV states. The experimental data is explained with a model considering carrier dynamics (0.8 ns), NV$^0$ spontaneous emission (20 ns) and NV$^0$ $\rightarrow$NV$^-$ back transfer (500 ms). The results provide new insights into the NV$^-$$\leftrightarrow$NV$^0$ conversion dynamics, and into the use of pump-probe cathodoluminescence as a nanoscale NV characterization tool.

The local density of optical states governs an emitters lifetime and quantum yield through the Purcell effect. It can be modified by a surface plasmon electromagnetic field, but such a field has a spatial extension limited to a few hundreds of nanometers, which complicates the use of optical methods to spatially probe the emitter-plasmon coupling. Here we show that a combination of electron-based imaging, spectroscopies and photon-based correlation spectroscopy enables measurement of the Purcell effect with nanometer and nanosecond spatio-temporal resolutions. Due to the large variability of radiative lifetimes of emitters embedded in nanoparticles with inhomogeneous sizes we relied on a statistical approach to unambiguously probe the coupling between nitrogen-vacancy centers (NV^0) in nanodiamonds and surface plasmons in silver nanocubes. We quantified the Purcell effect by measuring the NV^0 excited state lifetimes in a large number of either isolated nanodiamonds or nanodiamond-nanocube dimers and demonstrated a statistically significant lifetime reduction for dimers.