148 results on '"Zhang, En Xia"'
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2. Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate
3. Total-Ionizing-Dose Effects and Low-Frequency Noise in N-Type Carbon Nanotube Field-Effect Transistors With HfO₂ Gate Dielectrics
4. Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics
5. Effects of Geometry and Cycling on the Radiation Response of Charge-Trapping NAND Memory Devices With SiON Tunneling Oxide
6. Total-Ionizing-Dose Effects on 3D Sequentially-Integrated FDSOI Ring Oscillators
7. Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes
8. Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs
9. Low-Frequency Noise and Deep Level Transient Spectroscopy in n-p-n Si Bipolar Junction Transistors Irradiated with Si Ions
10. Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors with SiO2 Oxygen-Penetration Layers
11. Evaluating the Robustness of Complementary Channel Ferroelectric FETs Against Total Ionizing Dose Towards Radiation-Tolerant Embedded Nonvolatile Memory
12. Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors
13. Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors
14. Effects of Interface Traps and Hydrogen on the Low-Frequency Noise of Irradiated MOS Devices
15. Total-Ionizing-Dose Effects at Ultra-High Doses in AlGaN/GaN HEMTs
16. TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses
17. Effects of Layer-to-Layer Coupling on the Total-Ionizing-Dose Response of 3-D-Sequentially Integrated FD-SOI MOSFETs
18. Radiation-hardened silicon photonic passive devices on a 3 µm waveguide platform under gamma and proton irradiation
19. Radiation Effects in AlGaN/GaN HEMTs
20. Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs
21. Total-Ionizing-Dose Effects on Polycrystalline-Si Channel Vertical-Charge-Trapping Nand Devices
22. Total-Ionizing-Dose Response of SiGe HBTs at Elevated Temperatures
23. Aging Effects and Latent Interface-Trap Buildup in MOS Transistors
24. Radiation Effects and Low-Frequency Noise in AlGaN/GaN HEMTs
25. Effects of Charge Generation and Trapping on the X-ray Response of Strained AlGaN/GaN HEMTs
26. Supply Voltage Dependence of Ring Oscillator Frequencies for Total Ionizing Dose Exposures for 7-nm Bulk FinFET Technology
27. A System-Level Modeling Approach for Simulating Radiation Effects in Successive-Approximation Analog-to-Digital Converters
28. Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs
29. 3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs
30. Variability in Total-Ionizing-Dose Response of Fourth-Generation SiGe HBTs
31. Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting From Heavy-Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation
32. Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors
33. Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs
34. Total Ionizing Dose Responses of 22-nm FDSOI and 14-nm Bulk FinFET Charge-Trap Transistors
35. Charge Trapping and Transconductance Degradation in Irradiated 3-D Sequentially Integrated FDSOI MOSFETs
36. Single-Event Transient Response of Vertical and Lateral Waveguide-Integrated Germanium Photodiodes
37. Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser
38. Response of Integrated Silicon Microwave pin Diodes to X-ray and Fast-Neutron Irradiation
39. Sensitive-Volume Model of Single-Event Latchup for a 180-nm SRAM Test Structure
40. Total-Ionizing-Dose Effects in InGaAs MOSFETs With High-k Gate Dielectrics and InP Substrates
41. Total-Ionizing-Dose Effects on 3D Sequentially Integrated, Fully Depleted Silicon-on-Insulator MOSFETs
42. Charge Transport in Vertical GaN Schottky Barrier Diodes: A Refined Physical Model for Conductive Dislocations
43. The Impact of Proton-Induced Single Events on Image Classification in a Neuromorphic Computing Architecture
44. Comparison of Sensitive Volumes Associated With Ion- and Laser-Induced Charge Collection in an Epitaxial Silicon Diode
45. Total-Ionizing-Dose Effects on InGaAs FinFETs With Modified Gate-stack
46. Polarization Dependence of Pulsed Laser-Induced SEEs in SOI FinFETs
47. Total-Ionizing-Dose Effects and Low-Frequency Noise in 30-nm Gate-Length Bulk and SOI FinFETs With SiO2/HfO2Gate Dielectrics
48. Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO2/Al2O3 Dielectrics
49. Comparing the TID-induced RF performance degradation of floating body and body contacted 130 nm SOI NMOS transistors
50. Pulsed Laser-Induced Single-Event Transients in InGaAs FinFETs with sub-10-nm Fin Widths
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