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2. Management of an Intra-Orbital Tumor with Maxillary and Nasal Infection at the Nianankoro Fomba Hospital in Segou: About a Case

3. Ovarian Fibrothecoma: A Case Report

4. Epidemiological-Clinical Features of Anemia in Children Aged 6 to 59 Months Hospitalized in the Pediatrics Department of Nianankoro Fomba Hospital in Ségou

5. Epidemiological-Clinical Aspects of Bacterial Urinary Tract Infections in Children from 2 to 15 Years at the Nianankoro Fomba Hospital in Ségou

6. Functional Results of Small Incision Cataract Surgery at the Nianankoro FOMBA Hospital in Segou, a Second Reference Centre in Mali

9. Appendicular Mucocele about a Case at Nianankoro Fomba Hospital in Ségou

10. Giant Parotid Tumor at Nianankoro Fomba Hospital in Ségou: About a Case

13. Efficacité et tolérance du Latanoprost donné en première intention dans le traitement du glaucome primitif a angle ouvert chez le mélanoderme africain

15. Detecting differences with magnetoencephalography (MEG)-urodynamics study of somatosensory processing normal desire to void and maximum desire to void sensation

18. A 12nm FinFET Technology Featuring 2nd Generation FinFET for Low Power and High Performance Applications

19. Multiple Workfunction High Performance FinFETs for Ultra-low Voltage Operation

20. Abstract P-124

23. Scleroderma and HIV Infection: A Case Report with Literature Review

26. Novel N/PFET Vt control by TiN plasma nitridation for aggressive gate scaling

28. Advanced RMG module to improve AC/DC performance for 14nm FinFETs and beyond

30. Improved sidewall doping of extensions by AsH3 ion assisted deposition and doping (IADD) with small implant angle for scaled NMOS Si bulk FinFETs

34. Impact of through silicon via induced mechanical stress on fully depleted Bulk FinFET technology

35. Phosphorus doped SiC Source Drain and SiGe channel for scaled bulk FinFETs

36. RMG Tech. Integration in FinFET Devices

37. Device Architectures and Their Integration Challenges for 1x nm node: FinFETs with High Mobility Channel

40. Atom Probe Tomography for 3D-dopant analysis in FinFET devices

41. Bulk FinFET fabrication with new approaches for oxide topography control using dry removal techniques

42. Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs

43. On the rseries extraction techniques for sub-22nm CMOS finfet and SiGe technologies

46. Superior NBTI reliability of SiGe channel pMOSFETs: Replacement gate, FinFETs, and impact of Body Bias

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