43 results on '"Sierawski, Brian D."'
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2. Single Event Functional Interrupt (SEFI) Sensitivities of a Multicore Microprocessor
3. Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors
4. Total Ionizing Dose Responses of 22-nm FDSOI and 14-nm Bulk FinFET Charge-Trap Transistors
5. Sensitive-Volume Model of Single-Event Latchup for a 180-nm SRAM Test Structure
6. Inclusion of Radiation Environment Variability for Reliability Estimates for SiC Power MOSFETs
7. The Impact of Proton-Induced Single Events on Image Classification in a Neuromorphic Computing Architecture
8. Automatic Fault Tree Generation from Radiation-Induced Fault Models
9. RadFxSat: A Flight Campaign for Recording Single-Event Effects in Commercial Off-the-Shelf Microelectronics
10. CubeSat: Real-time soft error measurements at low earth orbits
11. Radiation Response and Adaptive Control-Based Degradation Mitigation of MEMS Accelerometers in Ionizing Dose Environments
12. A CubeSat-payload radiation-reliability assurance case using goal structuring notation
13. CubeSats and Crowd-Sourced Monitoring for Single Event Effects Hardness Assurance
14. Bayesian Inference Modeling of Total Ionizing Dose Effects on System Performance
15. Effects of Energy-Deposition Variability on Soft Error Rate Prediction
16. Physical Processes and Applications of the Monte Carlo Radiative Energy Deposition (MRED) Code
17. System Health Awareness in Total-Ionizing Dose Environments
18. Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers
19. The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets
20. Combined use of heavy ion and proton test data in the determination of a GaAs Power MESFET critical charge and sensitive depth
21. An efficient AVF estimation technique using circuit partitioning
22. Calibration of the weighed sensitive volume model to heavy ion experimental data
23. Effects of scaling on muon-induced soft errors
24. Dose Enhancement and Reduction in SiO$_{2}$ and High-$\kappa$ MOS Insulators
25. Muon-Induced Single Event Upsets in Deep-Submicron Technology
26. Contribution of Control Logic Upsets and Multi-Node Charge Collection to Flip-Flop SEU Cross-Section in 40-nm CMOS
27. Heavy Ion Testing With Iron at 1 GeV/amu
28. Monte Carlo Simulation of Single Event Effects
29. Effects of multi-node charge collection in flip-flop designs at advanced technology nodes
30. Contribution of low-energy (≪ 10 MeV) neutrons to upset rate in a 65 nm SRAM
31. General Framework for Single Event Effects Rate Prediction in Microelectronics
32. Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions
33. Heavy ion testing at the galactic cosmic ray energy peak
34. Effects of Surrounding Materials on Proton-Induced Energy Deposition in Large Silicon Diode Arrays
35. Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods
36. A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations
37. Monte-Carlo Based On-Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch
38. Distribution of Proton-Induced Transients in Silicon Focal Plane Arrays
39. Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $\mu$m CMOS SRAM
40. Modeling Alpha and Neutron Induced Soft Errors in Static Random Access Memories
41. Predicting Thermal Neutron-Induced Soft Errors in Static Memories Using TCAD and Physics-Based Monte Carlo Simulation Tools
42. Reducing Soft Error Rate in Logic Circuits Through Approximate Logic Functions
43. Satometer
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