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1. Unveiling Retention Physical Mechanism of Ge-rich GST ePCM Technology

3. BEOL Process Effects on ePCM Reliability

4. Heater system optimization for robust ePCM reliability and scalability in 28nm FDSOI technology

5. Improving Ge-rich GST ePCM reliability through BEOL engineering

6. High Density Embedded PCM Cell in 28nm FDSOI Technology for Automotive Micro-Controller Applications

7. Crystallization Speed in Ge-Rich PCM Cells as a Function of Process and Programming Conditions

8. Truly Innovative 28nm FDSOI Technology for Automotive Micro-Controller Applications embedding 16MB Phase Change Memory

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