77 results on '"Sajavaara T"'
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2. Al2O3 ALD films grown using TMA + rare isotope 2H216O and 1H218O precursors
3. Experimental evidence on photo-assisted O− ion production from Al2O3 cathode in cesium sputter negative ion source
4. Characterization of 233U alpha recoil sources for 229()Th beam production
5. Deuterium Retention in si Doped Carbon Films
6. Thermal atomic layer deposition of AlOxNy thin films for surface passivation of nano-textured flexible silicon
7. A new beamline for energy-dispersive high-resolution PIXE analysis using polycapillary optics
8. High quality superconducting titanium nitride thin film growth using infrared pulsed laser deposition
9. Tang dynasty (618–907) bowl measured with PIXE
10. Thin film growth into the ion track structures in polyimide by atomic layer deposition
11. Characterization of ALD grown Ti x Al y N and Ti x Al y C thin films
12. Oxy-nitrides characterization with a new ERD-TOF system
13. Minimum detection limits and applications of proton and helium induced X-ray emission using transition-edge sensor array
14. Theαandγplasma modes in plasma-enhanced atomic layer deposition with O2–N2capacitive discharges
15. Energy loss and straggling of MeV Si ions in gases
16. Stability, sub-gap current, 1/f-noise, and elemental depth profiling of annealed Al:Mn-AlOX-Al normal metal-insulator-superconducting tunnel junctions
17. Broadband Ultrahigh-Resolution Spectroscopy of Particle-Induced X Rays: Extending the Limits of Nondestructive Analysis
18. Mass calibration of the energy axis in ToF- E elastic recoil detection analysis
19. Determination of molecular stopping cross section of 12C, 16O, 28Si, 35Cl, 58Ni, 79Br, and 127I in silicon nitride
20. Potku – New analysis software for heavy ion elastic recoil detection analysis
21. Variation of lattice constant and cluster formation in GaAsBi
22. Transition-Edge Sensors for Particle Induced X-ray Emission Measurements
23. Recent negative ion source activity at JYFL
24. Evidence of quantum phase slip effect in titanium nanowires
25. Depth profiling of Al2O3+TiO2 nanolaminates by means of a time-of-flight energy spectrometer
26. Control of Oxygen Nonstoichiometry and Magnetic Property of MnCo2O4 Thin Films Grown by Atomic Layer Deposition
27. Experimental Linear Energy Transfer of Heavy Ions in Silicon for RADEF Cocktail Species
28. Considerations about multiple and plural scattering in heavy-ion low-energy ERDA
29. Aperture-edge scattering in MeV ion-beam lithography. II. Scattering from a rectangular aperture
30. Aperture-edge scattering in MeV ion-beam lithography. I. Scattering from a straight Ta aperture edge
31. Low-energy heavy-ion TOF-ERDA setup for quantitative depth profiling of thin films
32. Alkali-ion irradiated alpha-quartz: low-temperature cathodoluminescence after chemical epitaxy
33. Experimental Linear Energy Transfer of heavy ions in silicon for RADEF cocktail species
34. Mobility determination of lead isotopes in glass for retrospective radon measurements
35. Fabrication of microfluidic devices using MeV ion beam Programmable Proximity Aperture Lithography (PPAL)
36. Time-of-flight telescope for heavy-ion RBS
37. Depth resolution optimization for low-energy ERDA
38. Linear Energy Transfer of Heavy Ions in Silicon
39. The analysis of a thin SiO2/Si3N4/SiO2 stack: A comparative study of low-energy heavy ion elastic recoil detection, high-resolution Rutherford backscattering and secondary ion mass spectrometry
40. The impact of the density and type of reactive sites on the characteristics of the atomic layer deposited WNxCy films
41. Short-ranged structural rearrangement and enhancement of mechanical properties of organosilicate glasses induced by ultraviolet radiation
42. Atomic Layer Deposition and Properties of Lanthanum Oxide and Lanthanum-Aluminum Oxide Films
43. Overview of material re-deposition and fuel retention studies at JET with the Gas Box divertor
44. Study of thermal stability of nickel silicide by X-ray reflectivity
45. Characterization of high and low k dielectrica using low-energy Time of Flight Elastic Recoil Detection
46. Reduction of Copper Oxide Film to Elemental Copper
47. Round Robin: measurement of H implantation distributions in Si by elastic recoil detection
48. Thin film nanolaminate analysis by simultaneous heavy ion recoil and X-ray spectrometry
49. Atomic Layer Deposition of Photocatalytic TiO2 Thin Films from Titanium Tetramethoxide and Water
50. Chemically guided epitaxy of Rb-irradiated α-quartz
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