1. Patterns
- Author
-
Koppenwallner, G. E., primary, Etling, D., additional, Leong, C.-W., additional, Ottino, J. M., additional, Villermaux, E., additional, Duplat, J., additional, Weidman, P. D., additional, Afenchenko, V. O., additional, Ezersky, A. B., additional, Kiyashko, S. V., additional, Rabinovich, M. I., additional, Bodenschatz, E., additional, Morris, S. W., additional, De bruyn, J. R., additional, Cannell, D. S., additional, Ahlers, G., additional, Chen, C. F., additional, Zoueshtiagh, F., additional, Thomas, P. J., additional, Gauthier, G., additional, Gondret, P., additional, Moisy, F., additional, Rabaud, M., additional, Fermigier, M., additional, Jenffer, P., additional, Tan, E., additional, Thoroddsen, S. T., additional, Vukasinovic, B., additional, Glezer, A., additional, Smith, M. K., additional, Zabusky, N. J., additional, Townsend, W., additional, Hess, R. A., additional, Brock, N. J., additional, Weber, B. J., additional, Carr, L. W., additional, and Chandrasekhara, M. S., additional
- Published
- 2004
- Full Text
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