37 results on '"Prosa, T"'
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2. Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards
3. Composition profiling of GaAs/AlGaAs quantum dots grown by droplet epitaxy
4. Elemental Quantification and Visualization of GaN Structures using APT and SIMS
5. Correlative Compositional Analysis of Fiber-Optic Nanoparticles
6. Compositional and Structural Analysis of Al-doped ZnO Multilayers by LEAP
7. Atom probe tomography of a commercial light emitting diode
8. Atom Probe Tomography of Oxide Scales
9. Three-dimensional chemical imaging of embedded nanoparticles using atom probe tomography
10. Toward atom probe tomography of microelectronic devices
11. From the Store Shelf to Device-Level Atom Probe Analysis: An Exercise in Feasibility
12. Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data
13. Complimentary Chemical Imaging of Au-Nanoparticles Embedded in MgO using Laser Assisted Atom Probe Tomography
14. Analytic Hitmap Equation of the Ideal Spherical Evaporator
15. Toward Automated Optimization of Reconstruction of Atom Probe Data
16. MeasuringContributions to Mass Resolving Power in Atom Probe Tomography
17. Atom Probe Tomography Analysis of Thick Film SiO2 and Oxide Interfaces: Conditions Leading to Improved Analysis Yield
18. Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy
19. Prospects for Atom Probe Tomography of Commercial Semiconductor Devices
20. Improved Yield and Data Quality in Atom Probe Tomography
21. Erratum: “Atom probe analysis of interfacial abruptness and clustering within a single InxGa1−xN quantum well device on semipolar (101¯1¯) GaN substrate” [Appl. Phys. Lett. 98, 191903 (2011)]
22. Atom probe analysis of interfacial abruptness and clustering within a single InxGa1−xN quantum well device on semipolar (101¯1¯) GaN substrate
23. Evolution of tip shape during field evaporation of complex multilayer structures
24. Characterization of dilute species within CVD‐grown silicon nanowires doped using trimethylboron: protected lift‐out specimen preparation for atom probe tomography
25. Analysis of Silicon Nanowires by Laser Atom Probe Tomography Prepared by a Protected Lift-Out Processing Technique
26. Recent Advances in Analysis of Organic Materials using LEAPÆ Tomography
27. Compositional Imaging at the Atomic Scale with Atom Probe Tomography
28. Depth Dependent Oxidation States in a PtRu Thin Film
29. Atom Probe Tomography of Al-Cu Precipitation in an Al-5 at.%Cu Thin Film
30. An Automatic Electropolishing System for Needle-Shaped Specimens
31. A Correlative Study of an Iron-Base Superalloy Using Transmission Electron Microscopy and Atom Probe Tomography
32. Laser Atom Probe Tomography: Application to Polymers
33. Diffraction Line-Shape Analysis of Poly(3-dodecylthiophene): A Study of Layer Disorder through the Liquid Crystalline Polymer Transition
34. Evolution of Microstructure in the Liquid and Crystal Directions in a Quenched Block Copolymer Melt
35. Evidence of a Novel Side Chain Structure in Regioregular Poly(3-alkylthiophenes)
36. X-ray-diffraction studies of the three-dimensional structure within iodine-intercalated poly(3-octylthiophene)
37. X-ray structural studies of poly(3-alkylthiophenes): an example of an inverse comb
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