77 results on '"Pellish, Jonathan A."'
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2. Technology Options for Extreme Environment Electronics
3. NASA Goddard Space Flight Center’s Recent Radiation Effects Test Results
4. Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center
5. Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory
6. Single-Event Transient Case Study for System-Level Radiation Effects Analysis
7. Single-Event Response of 22-nm Fully Depleted Silicon-on-Insulator Static Random Access Memory
8. NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results
9. Development of a Flight-Program-Ready Radiation Model-Based Assurance Platform
10. NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results
11. The effects of gamma radiation on digital micromirror devices
12. NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results
13. Evaluation of digital micromirror devices for use in space-based multiobject spectrometer application
14. Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program
15. Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program
16. The effects of heavy ion radiation on digital micromirror device performance
17. The effects of heavy ion radiation on digital micromirror device performance
18. Compendium of Single Event Effect Results from NASA Goddard Space Flight Center
19. Compendium of Total Ionizing Dose and Displacement Damage Results from NASA Goddard Spaceflight Center
20. Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA
21. Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA
22. Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies
23. Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA
24. Single Event Induced Multiple Bit Errors and the Effects of Logic Masking
25. Characterizing the Effects of Single Event Upsets on Synchronous Data Paths
26. Compendium of Recent Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA
27. VCSEL and Photodiode Proton Test Results for an Optical Communications Link
28. Compendium of Recent Single Event Effects for Candidate Spacecraft Electronics for NASA
29. Editor comments
30. IEEE Nuclear and Space Radiation Effects Conference: Notes on the Early Conferences
31. Hardness Assurance Testing for Proton Direct Ionization Effects
32. A Comparison of High-Energy Electron and Cobalt-60 gamma-Ray Radiation Testing
33. Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA
34. Compendium of Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA
35. Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs
36. 32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches
37. The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy Protons
38. Hardness assurance testing for proton direct ionization effects
39. Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems
40. Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems
41. Impact of Spacecraft Shielding on Direct Ionization Soft Error Rates for Sub-130 nm Technologies
42. Reconciling 3-D Mixed-Mode Simulations and Measured Single-Event Transients in SiGe HBTs
43. Muon-Induced Single Event Upsets in Deep-Submicron Technology
44. Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16–300 K
45. Heavy Ion Testing With Iron at 1 GeV/amu
46. Non-TMR SEU-Hardening Techniques for SiGe HBT Shift Registers and Clock Buffers
47. Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements
48. Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA
49. Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
50. Radiation Performance of Commercial SiGe HBT BiCMOS High Speed Operational Amplifiers
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