7 results on '"Oeder, Thorsten"'
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2. Gate-Induced Threshold Voltage Instabilities in p-Gate GaN HEMTs
3. Gate-Stress-Induced Threshold Voltage Instabilites, a Comparison of Ohmic and Schottky p-Gate GaN HEMTs
4. Impact of Carrier Accumulation on the Transient Behavior of p-Gate GaN HEMTs
5. Single pulse short-circuit robustness and repetitive stress aging of GaN GITs
6. Electrical and thermal failure modes of 600 V p-gate GaN HEMTs
7. Experimental study of the short-circuit performance for a 600V normally-off p-gate GaN HEMT
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