38 results on '"Micha, J S"'
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2. Energy-dispersive X-ray micro Laue diffraction on a bent gold nanowire
3. First stages of plasticity in three-point bent Au nanowires detected by in situ Laue microdiffraction
4. Three-point bending behavior of a Au nanowire studied by in-situ Laue micro-diffraction
5. Plasticity in inhomogeneously strained Au nanowires studied by Laue microdiffraction
6. Local strain redistribution in a coarse-grained nickel-based superalloy subjected to shot-peening, fatigue or thermal exposure investigated using synchrotron X-ray Laue microdiffraction
7. Direct measurement of local constitutive relations, at the micrometre scale, in bulk metallic alloys
8. Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector
9. Dislocation-twin boundary interaction in small scale Cu bi-crystals loaded in different crystallographic directions
10. Mechanical behaviour near grain boundaries of He-implanted UO2 ceramic polycrystals
11. KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application toin situmechanically loaded nanowires
12. Temperature dependency of the strain distribution induced by TSVs in silicon: A comparative study between micro-Laue and monochromatic nano-diffraction
13. On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment
14. On the reversibility of dislocation slip during small scale low cycle fatigue
15. Laue pattern analysis for two-dimensional strain mapping in light-ion-implanted polycrystals
16. Laue-DIC: a new method for improved stress field measurements at the micrometer scale
17. Effect of the temperature on the strain distribution induced in silicon interposer by TSVs: A comparison between micro-Laue and monochromatic nanodiffraction
18. A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device
19. Synchrotron radiation-based characterization of interconnections in microelectronics: recent 3D results
20. Publisher's Note: “Structural and optical analyses of GaP/Si and (GaAsPN/GaPN)/GaP/Si nanolayers for integrated photonics on silicon” [J. Appl. Phys. 112, 053521 (2012)]
21. Investigation of reversible plasticity in a micron-sized, single crystalline copper bending beam by X-rayμLaue diffraction
22. Structural and optical analyses of GaP/Si and (GaAsPN/GaPN)/GaP/Si nanolayers for integrated photonics on silicon
23. Strains in light-ion-implanted polycrystals: influence of grain orientation
24. Coherent integration of photonics on silicon through the growth of nanostructures on GaP/Si
25. Dislocation storage in single slip-oriented Cu micro-tensile samples: new insights via X-ray microdiffraction
26. A new white beam x-ray microdiffraction setup on the BM32 beamline at the European Synchrotron Radiation Facility
27. Recent developments in white and monochromatic X-ray microdiffraction
28. Hydrated cholesterol: Phospholipid domains probed by synchrotron radiation
29. Effects of thermal annealing on C/FePt granular multilayers:in situandex situstudies
30. Erratum: “New reactor dedicated to in operando studies of model catalysts by means of surface x-ray diffraction and grazing incidence small angle x-ray scattering” [Rev. Sci. Instrum. 78, 083902 (2007)]
31. Inversion of the diffraction pattern from an inhomogeneously strained crystal using an iterative algorithm
32. Investigation by High Resolution X-ray Diffraction of the local strains induced in Si by periodic arrays of oxide filled trenches
33. New reactor dedicated toin operandostudies of model catalysts by means of surface x-ray diffraction and grazing incidence small angle x-ray scattering
34. Strain field in silicon on insulator lines using high resolution x-ray diffraction
35. D058 Determination of local strain field in SOI lines using high resolution X-ray diffraction
36. Extension of the resonant scattering technique to liquid crystals without resonant element
37. Structural investigations of Co/ZrO2discontinuous multilayers by x-ray absorption fine structure spectroscopy
38. Structural and morphological studies of Co/SiO2 discontinuous multilayers
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