122 results on '"Gergaud, P."'
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2. Evolution of the Ni0.9Pt0.1/Si system under annealing via nano-crystalline textured phases
3. Towards the understanding of the Ti/Al ratio role in solid-state reaction for ohmic contacts on n-GaN
4. Investigations at low temperature of 90 nm pitch BEOL for quantum applications
5. In-situ mapping of local orientation and strain in a fully operable infrared sensor
6. Ni2P Contact Technology for 300 mm Si Photonics Platform
7. Platinum redistribution in the Ni0.9Pt0.1/InP system: Impact on solid-state reaction and layer morphology
8. Superconducting V3Si for quantum circuit applications
9. Influence of dual Ge/C pre-amorphization implantation on the Ni1−Pt Si phase nucleation and growth mechanisms
10. Enhanced thermal stability of Ni/GeSn system using pre-amorphization by implantation
11. Influence of substrate-induced thermal stress on the superconducting properties of V3Si thin films
12. Nickel-based CMOS-compatible contacts on p-In0.53Ga0.47 As for III-V / silicon hybrid lasers
13. Investigation of recrystallization and stress relaxation in nanosecond laser annealed Si1−xGex/Si epilayers
14. Potentialities of LiTaO3 for Bulk Acoustic Wave Filters
15. Study of the Ti/InGaAs solid-state reactions: Phase formation sequence and diffusion schemes
16. Integration, BEOL, and Thermal Stress Impact on CMOS-Compatible Titanium-Based Contacts for III–V Devices on a 300-mm Platform
17. Grazing-incidence X-ray fluorescence analysis of thin chalcogenide materials deposited on Bragg mirrors
18. X-Ray Determination of Stresses Distribution in a Coarse Grained Silicon Billet
19. Remote epitaxy using graphene enables growth of stress-free GaN
20. Impact of Germanium Concentration on the Ultraviolet Nanosecond Laser Annealing of Intrinsic Si1-xGex Epitaxial Layers
21. An investigation of the influence of thermal process on the electrical conductivity of LIFT printed Cu structures
22. Impact of UV Nanosecond Laser Annealing on Composition and Strain of Undoped Si0.8Ge0.2 Epitaxial Layers
23. Redistribution of phosphorus during NiPtSi formation on in-situ doped Si
24. Grazing incident X-ray fluorescence combined with X-ray reflectometry metrology protocol of telluride-based films using in-lab and synchrotron instruments
25. Phase formation sequence and cobalt behavior in the Ni0.9 Co0.1 system during the thin film solid-state formation
26. Strain Management in Germanium-On-Insulator (GeOI) Substrates for Photonic Applications
27. In-situ X-ray diffraction on functional thin films using a laboratory source during electrical biasing
28. Impact of Pt on the phase formation sequence, morphology, and electrical properties of Ni(Pt)/Ge0.9Sn0.1 system during solid-state reaction
29. CMOS-Compatible Contacts for Si Photonics from Solid-State Reaction to Laser Integration
30. Impact of Sn content in Ge1−xSnx layers on Ni-stanogermanides solid-state reaction and properties
31. Understanding and improving the low optical emission of InGaAs quantum wells grown on oxidized patterned (001) silicon substrate
32. SiGe nano-heteroepitaxy on Si and SiGe nano-pillars
33. Anti phase boundary free GaSb layer grown on 300 mm (001)-Si substrate by metal organic chemical vapor deposition
34. Ni and Ti silicide oxidation for CMOS applications investigated by XRD, XPS and FPP
35. Advanced characterizations of fluorine-free tungsten film and its application as low resistance liner for PCRAM
36. SiGe oxidation kinetics and oxide density measured by resonant soft X-ray reflectivity
37. Formation of Ni3InGaAs phase in Ni/InGaAs contact at low temperature
38. Effect of structural in-depth heterogeneities on electrical properties of Pb(Zr0.52Ti0.48) O3 thin films as revealed by nano-beam X-ray diffraction
39. Contacts for monolithic 3D architecture: Study of Ni0.9Co0.1 silicide formation
40. HRXRD for in-line monitoring of advanced FD-SOI technology: Use-cases: AM: Advanced metrology
41. A study of lateral roughness evaluation through critical-dimension small angle x-ray scattering (CD-SAXS)
42. Chemistry of surface nanostructures in lead precursor-rich PbZr0.52Ti0.48O3 sol–gel films
43. Polysilicon nanowire NEMS fabricated at low temperature for above IC NEMS mass sensing applications
44. 300 mm InGaAsOI substrate fabrication using the Smart CutTM technology
45. Solid state reaction of Ni thin film on n-InP susbtrate for III-V laser contact technology
46. Full 3D reciprocal space map of thin polycrystalline films for microelectronic applications
47. Influence of the substrate on the solid-state reaction of ultra-thin Ni film with a In0.53Ga0.47As under-layer by means of full 3D reciprocal space mapping
48. Correlation between electric-field-induced phase transition and piezoelectricity in lead zirconate titanate films
49. Synchrotron radiation-based characterization of interconnections in microelectronics: recent 3D results
50. Kinetics study of NiPt(10 at.%)/Si0.7Ge0.3 solid state reactions
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