6 results on '"Duan, Guo Xing"'
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2. Total Ionizing Dose Effects on Ge Channel $p$FETs with Raised ${\rm Si}_{0.55}{\rm Ge}_{0.45}$ Source/Drain
3. Activation Energies for Oxide- and Interface-Trap Charge Generation Due to Negative-Bias Temperature Stress of Si-Capped SiGe-pMOSFETs
4. Bias Dependence of Total Ionizing Dose Effects in SiGe-MOS FinFETs
5. Electrical Stress and Total Ionizing Dose Effects on ${\hbox {MoS}}_{2}$Transistors
6. Total Ionizing Dose Effects on hBN Encapsulated Graphene Devices
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