10 results on '"Deimel M"'
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2. Study of molecular surface diffusion by imaging static secondary ion mass spectrometry (SIMS): polymers on Ag-surfaces
3. Examination of organosilicon impregnating mixtures by static SIMS and diffuse reflectance FT-IR
4. Time-resolved identification of single molecules in solution with a pulsed semiconductor diode laser
5. Chemisorption of poly(methylhydrogensiloxane) on oxide surfaces: a quantitative investigation using static SIMS
6. Combined instrument for the on‐line investigation of plasma deposited or etched surfaces by monochromatized x‐ray photoelectron spectroscopy and time‐of‐flight secondary ion mass spectrometry
7. Quantification of molecular secondary ion mass spectrometry by internal standards
8. Analysis of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry (TOF-SIMS)
9. The viscous creep component in shallow clayey soil and the influence of tree load on creep rates
10. Untersuchungen mit H3-markierten Aminosäuren zur Proteinsynthese in der regenerierenden Rattenleber
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