19 results on '"Steinert, Steffen"'
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2. Direct correlation between mask registration and on-wafer measurements for individual logic device features
3. New registration calibration strategies for MBMW tools by PROVE measurements
4. Emotions, values and technology: illuminating the blind spots
5. Propagation of Spin-Wave Packets in Individual Nanosized Yttrium Iron Garnet Magnonic Conduits
6. The impact of the reticle and wafer alignment mark placement accuracy on the intra-field mask-to-mask overlay
7. Intra-field mask-to-mask overlay, separating the mask writing from the dynamic pellicle contribution
8. Registration performance on EUV masks using high-resolution registration metrology
9. Co-optimization of RegC and TWINSCAN corrections to improve the intra-field on-product overlay performance
10. Highly Sensitive Detection of Physiological Spinsin a Microfluidic Device.
11. On the benefit of high resolution and low aberrations for in-die mask registration metrology
12. Glycolipid Trafficking in Drosophila Undergoes Pathway Switching in Response to Aberrant Cholesterol Levels
13. Glycolipid Trafficking in DrosophilaUndergoes Pathway Switching in Response to Aberrant Cholesterol Levels
14. A fluorescent sphingolipid binding domain peptide probe interacts with sphingolipids and cholesterol-dependent raft domainss⃞
15. A fluorescent sphingolipid binding domain peptide probe interacts with sphingolipids and cholesterol-dependent raft domains
16. Cell tracking velocimetry as a tool for defining saturation binding of magnetically conjugated antibodies
17. The mask contribution as part of the intra-field on-product overlay performance
18. Wafer alignment mark placement accuracy impact on the layer-to-layer overlay performance
19. Off-line mask-to-mask registration characterization as enabler for computational overlay
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