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1. Simple method for accurate characterization of birefringent crystals

Author

Lee, Peter S. K., Pors, J. B., van Exter, Martin P., and Woerdman, J. P.

Abstract

We present a simple method to determine the cutting angle and thickness of birefringent crystals. Our method is based on chromatic polarization interferometry and allows for accuracies of typically 0.1° in the cutting angle and 0.5% in the thickness.

Published
2005

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