1. Modifications in Fullerene C70 Thin Film induced by Dense Ionization and Thermal Treatment.
- Author
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Singhal, Rahul, Vishnoi, Ritu, Inani, Heena, Sharma, Amit Kumar, and Sharma, G.D.
- Subjects
FULLERENE thin films ,RAMAN spectroscopy ,SURFACE roughness measurement ,ATOMIC force microscopy ,HEAVY ions - Abstract
This study presents the comparative modifications in optical, structural and morphological properties of fullerene C 70 thin film induced by swift heavy ion irradiation and thermal annealing. Fullerene C 70 thin films are prepared by resistive heating method on quartz substrates. One set of the films are irradiated with 125 MeV Au ions at different fluences varying from 1×10 12 to 3×10 13 ions/cm 2 and second set of the films are annealed at temperatures varying from 50 to 350 ̊C for 30 minutes. The UV-visible spectroscopy and Raman spectroscopy are performed on pristine, irradiated and annealed films to investigate the modification in optical and structural properties after irradiation and annealing. UV-visible spectra show that the optical band gap of fullerene C 70 film decrease with increasing fluence and temperature. The experiment using Raman scattering exhibits the transformation of fullerene C 70 into amorphous carbon at higher fluences and higher temperatures as well. This transformation is evidenced by the presence of D and G bands of amorphous carbon in irradiated and annealed films. Atomic force microscopy is performed to observe the variation in surface roughness of films variation with irradiation and temperature. Swift ion irradiation induces the cylindrical zone so called “ion track” made of amorphous materials with in the fullerene C 70 thin films. The damage cross-section and radius of cylindrical zone is calculated to be 2.8 ×10 -13 cm 2 and 3.0 nm respectively using the kinetics of damage of fullerene C 70 . [ABSTRACT FROM AUTHOR]
- Published
- 2017
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