29 results on '"Sajavaara T"'
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2. Characterization of 233U alpha recoil sources for 229(m)Th beam production
3. A new beamline for energy-dispersive high-resolution PIXE analysis using polycapillary optics
4. Tang dynasty (618–907) bowl measured with PIXE
5. Minimum detection limits and applications of proton and helium induced X-ray emission using transition-edge sensor array
6. Oxy-nitrides characterization with a new ERD-TOF system
7. Thin film growth into the ion track structures in polyimide by atomic layer deposition
8. Characterization of ALD grown TixAlyN and TixAlyC thin films
9. Energy loss and straggling of MeV Si ions in gases
10. Mass calibration of the energy axis in ToF-E elastic recoil detection analysis
11. Determination of molecular stopping cross section of 12C, 16O, 28Si, 35Cl, 58Ni, 79Br, and 127I in silicon nitride
12. Potku – New analysis software for heavy ion elastic recoil detection analysis
13. Depth profiling of Al 2O 3 + TiO 2 nanolaminates by means of a time-of-flight energy spectrometer
14. Considerations about multiple and plural scattering in heavy-ion low-energy ERDA
15. Depth resolution optimization for low-energy ERDA
16. Time-of-flight telescope for heavy-ion RBS
17. Analysis of thin high-k and silicide films by means of heavy ion time-of-flight forward-scattering spectrometry
18. The analysis of a thin SiO2/Si3N4/SiO2 stack: A comparative study of low-energy heavy ion elastic recoil detection, high-resolution Rutherford backscattering and secondary ion mass spectrometry
19. Irradiation-induced damage in porous low-k materials during low-energy heavy-ion elastic recoil detection analysis
20. Characterization of high and low k dielectrica using low-energy Time of Flight Elastic Recoil Detection
21. Study of thermal stability of nickel silicide by X-ray reflectivity
22. A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films
23. Round Robin: measurement of H implantation distributions in Si by elastic recoil detection
24. Thin film nanolaminate analysis by simultaneous heavy ion recoil and X-ray spectrometry
25. Chemically guided epitaxy of Rb-ion amorphized α-quartz: the roles of Rb and oxygen
26. Ion beam mixing in Fe/Si and Ta/Si bilayers: Possible effects of ion charges
27. Studies of impurity deposition/implantation in JET divertor tiles using SIMS and ion beam techniques
28. Epitaxial recrystallization of amorphized α-quartz after sodium ion implantation and oxygen annealing
29. The production of the new cubic FeN phase by reactive magnetron sputtering
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