20 results on '"Pouget, V."'
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2. Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge
3. Reliability-driven pin assignment optimization to improve in-orbit soft-error rate
4. Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applications
5. Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells
6. Approximate TMR based on successive approximation and loop perforation in microprocessors
7. Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions
8. A calculation method to estimate single event upset cross section
9. Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis
10. Application of various optical techniques for ESD defect localization
11. Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation
12. Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
13. Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits
14. From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing
15. Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization
16. Front Side and Backside OBIT Mappings applied to Single Event Transient Testing
17. Theoretical Investigation of an Equivalent Laser LET
18. Laser cross section measurement for the evaluation of single-event effects in integrated circuits
19. Validation of radiation hardened designs by pulsed laser testing and SPICE analysis
20. A physical approach on SCOBIC investigation in VLSI
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