6 results on '"O'uchi, Shin-ichi"'
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2. Impact of residual defects caused by extension ion implantation in FinFETs on parasitic resistance and its fluctuation
3. Improvement of epitaxial channel quality on heavily arsenic- and boron-doped Si surfaces and impact on performance of tunnel field-effect transistors
4. Performance evaluation of parallel electric field tunnel field-effect transistor by a distributed-element circuit model
5. Enhancement of FinFET performance using 25-nm-thin sidewall spacer grown by atomic layer deposition
6. Flex-pass-gate SRAM for static noise margin enhancement using FinFET-based technology
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