10 results on '"Linten, D."'
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2. The impact of self-heating and its implications on hot-carrier degradation – A modeling study
3. Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
4. Comphy — A compact-physics framework for unified modeling of BTI
5. A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability
6. Quantitative retention model for filamentary oxide-based resistive RAM
7. The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits
8. Causes and consequences of the stochastic aspect of filamentary RRAM
9. A plug-and-play wideband RF circuit ESD protection methodology: T-diodes
10. Implementation of plug-and-play ESD protection in 5.5 GHz 90 nm RF CMOS LNAs—Concepts, constraints and solutions
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