24 results on '"Konarski, P."'
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2. Modification of magnetron sputter deposition of nc-WC/a-C(:H) coatings with an additional RF discharge
3. Application of ‘Storing Matter’ technique in SIMS depth profile analysis
4. Nano-multilayered coatings of (TiAlSiY)N/MeN (Me=Mo, Cr and Zr): Influence of composition of the alternating layer on their structural and mechanical properties
5. Superhard CrN/MoN coatings with multilayer architecture
6. Nanostructured multielement (TiHfZrNbVTa)N coatings before and after implantation of N+ ions (1018 cm−2): Their structure and mechanical properties
7. Spectral analysis of nanosize forms of carbon synthesized by pulsed intense ion beams
8. Improvement of high temperature oxidation resistance of AISI 316L stainless steel by incorporation of Ce–La elements using intense pulsed plasma beams
9. Fluorine-doped SiO 2 and fluorocarbon low- k dielectrics investigated by SIMS
10. Application of r.f. plasma ultrashallow nitrogen ion implantation for pedestal oxynitride layer formation
11. Critical currents density and current loops range in MgB 2 thin layers obtained by the technique of ions implantation followed by pulsed plasma transient annealing
12. Ion mass interferences and matrix effects on SIMS depth profiling of thin Ti/Si multilayer films induced by hydrogen, carbon and oxygen contaminations
13. Comparison of urban and rural particulate air pollution characteristics obtained by SIMS and SSMS
14. SIMS characterisation of superconductive MgB 2 layers prepared by ion implantation and pulsed plasma treatment
15. SIMS investigation of nitride coatings
16. Ion beam shadowing effects in SIMS depth profile analysis of MBE-grown nanostructures
17. Ion beam analysis of urban aerosol micro and nanoparticles compared with environmentally related children diseases in two Polish towns
18. Core–shell morphology of welding fume micro- and nanoparticles
19. SIMS depth profiling of working environment nanoparticles
20. B 4C/Mo/Si and Ta 2O 5/Ta nanostructures analysed by ultra-low energy argon ion beams
21. Erratum to “ Morphology of micro- and nanoparticles emitted by copper plants in Western Poland” [Thin Solid Films 459 (2004) 86–89]
22. Surface roughening at the ZnTe/GaAs interface in stationary and sample rotation SIMS depth profiling
23. Influence of Al adsorption on In and Ga thermal desorption from InP and GaAs surfaces heated under As 4 flux
24. Morphology of the [formula omitted] interface in the MBE-grown heterostructures analysed by SIMS depth profiling
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