27 results on '"Klapetek Petr"'
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2. Scanning Probe Microscopy controller with advanced sampling support
3. GSvit — An open source FDTD solver for realistic nanoscale optics simulations
4. SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis
5. Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy
6. Modeling the influence of roughness on nanoindentation data using finite element analysis
7. Fast mechanical model for probe–sample elastic deformation estimation in scanning probe microscopy
8. Ellipsometry of surface layers on a 1-kg sphere from natural silicon
9. Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy
10. The development of the spatially correlated adjustment wavelet filter for atomic force microscopy data
11. Methods for topography artifacts compensation in scanning thermal microscopy
12. Correlative microscopy of radial junction nanowire solar cells using nanoindent position markers
13. State of the art Raman techniques for biological applications
14. One-dimensional autocorrelation and power spectrum density functions of irregular regions
15. Rough surface scattering simulations using graphics cards
16. Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films
17. Optical characterization of ultrananocrystalline diamond films
18. Near-field scanning optical microscope probe analysis
19. Near-field scanning optical microscopy studies of thin film surfaces and interfaces
20. Electromagnetic field distribution modelling in microlenses fabrication process
21. Influence of technological conditions on mechanical stresses inside diamond-like carbon films
22. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD
23. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces
24. Optical properties of ZnTe films prepared by molecular beam epitaxy
25. Complete characterization of rough polymorphous silicon films by atomic force microscopy and the combined method of spectroscopic ellipsometry and spectroscopic reflectometry
26. Theoretical analysis of the atomic force microscopy characterization of columnar thin films
27. 50 Hz magnetic field effect on the morphology of bacteria
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