8 results on '"Denais, M."'
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2. Designing in reliability in advanced CMOS technologies
3. NBTI degradation: From physical mechanisms to modelling
4. Multi-vibrational hydrogen release: Physical origin of Tbd, Qbd power-law voltage dependence of oxide breakdown in ultra-thin gate oxides
5. Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs
6. Evidence and modelling current dependence of defect generation probability and its impact on charge to breakdown
7. A thorough investigation of MOSFETs NBTI degradation
8. Breakdown mechanisms in ultra-thin oxides: impact of carrier energy and current through substrate hot carrier stress study
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