14 results on '"Bosman, Michel"'
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2. Enhancement in rate performance and high voltage structural stability of P3/O3 Na0.9Fe0.5Mn0.45Ni0.05O2 layered oxide cathode
3. Anisotropic point defects in rhenium diselenide monolayers
4. Compliance current dominates evolution of NiSi2 defect size in Ni/dielectric/Si RRAM devices
5. Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory
6. Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach
7. Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices
8. Assessment of read disturb immunity in conducting bridge memory devices – A thermodynamic perspective
9. Study of preferential localized degradation and breakdown of HfO2/SiOx dielectric stacks at grain boundary sites of polycrystalline HfO2 dielectrics
10. Annular electron energy-loss spectroscopy in the scanning transmission electron microscope
11. Evidence for compliance controlled oxygen vacancy and metal filament based resistive switching mechanisms in RRAM
12. Physical analysis of breakdown in high-κ/metal gate stacks using TEM/EELS and STM for reliability enhancement (invited)
13. Optimizing EELS acquisition
14. Ondrej Krivanek: A Research Life in EELS and Aberration Corrected STEM
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