6 results on '"Baillin, X."'
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2. New method to evaluate materials outgassing used in MEMS thin film packaging technology
3. Structure and characterization of the dislocations in tilt grain boundaries between Σ = 1 and Σ = 3; a high resolution electron microscopy study
4. Structure and characterization of the dislocations in tilt grain boundaries between Σ = 1 and Σ = 3: a high resolution electron microscopy study
5. In situ HVEM Observations of Dislocation Transmission by Σ = 9 Grain Boundaries in Silicon
6. Chapter 67 - Influence of Short-Range Order on the Mechanical Behaviour of Alloy 600
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