Search

We prepared the Kesterite Cu2ZnSnS4 (CZTS) absorber thin films deposited by a singletarget RF magnetron sputtering system. The as-grown CZTS film was sulfurized in an H2S environment. The structural and optical properties of CZTS thin films were studied by using X-Ray diffraction (XRD), Raman spectrometer, atomic force microscopy (AFM) and UV-Vis spectrophotometer techniques. The XRD analysis showed the presence of a single peak corresponding tothe (112) plane. The Raman results confirmed the formation of the pure CZTS phase. The direct optical band gap calculated by Tauc plot analysis is approximately 1.5 eV, which is suitable for solar cell applications. The scanning electron microscopy (SEM) images showed the spherical and uniform morphology of prepared CZTS thin films. We believe that the controlled deposition parameters for the RF sputtering and the generated data presented here will have immediate applications in the deposition of high-quality CZTS-based materials for energy device fabrication.&nbsp